Part Details | GUIDED MISSILE TEST SET
4935-01-187-3332 A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a Guided Missile. Excludes individual test sets designed for a single specific function.
Alternate Parts: 57381, 3590778, 4935-01-187-3332, 01-187-3332, 4935011873332, 011873332
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 49 | AUG 21, 1984 | 01-187-3332 | 03642 ( TEST SET, GUIDED MISSILE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 4935-01-187-3332
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 57381 | 64000 | HEMAKIT INC |
| 3590778 | 55974 | HONEYWELL INTL INCDEFENSE AVIONICS SYSTEMS |
Technical Data | NSN 4935-01-187-3332
| Characteristic | Specifications |
|---|---|
| MAJOR COMPONENTS | LOGIC DEVELOPMENT STATION; TAPE CARTRIDGE; TAPE; DISK DRIVE; PRINTER; EMULATOR,TAPE AND MEMORY; ASSEMBLER/LINKER TAPE; 40-CHANNEL EMULATION BUS LOGIC ANALYZER TAPE; PROM PROGRAMMER SUBSYSTEM AND TAPE; PROM MODULE; SIGNETICS |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | GUIDED MISSILE TEST SET |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | AN/DSM-157 |
| SPECIAL FEATURES | SELF-CONTAINED; PORTABLE; TEST AGM-65 MISSILE SYSTEM |