Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-168-0954 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 245MF, TS1836BU, 6625-00-168-0954, 00-168-0954, 6625001680954, 001680954
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | OCT 21, 1968 | 00-168-0954 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-168-0954
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 245MF | 93346 | COBHAM ADVANCED ELECTRONIC SOLUTIONSINC. |
| TS1836BU | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-168-0954
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | GENERAL PURPOSE ELECTRICAL POWER EQUIPMENT |
