Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-188-5851 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: R16ANTS286U, TS268U, 6625-00-188-5851, 00-188-5851, 6625001885851, 001885851
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1963 | 00-188-5851 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-188-5851
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| R16ANTS286U | 99993 | DEPARTMENT OF THE NAVY |
| TS268U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-188-5851
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TESTING FROM RESISTANCE,BACK RESISTANCE AND BACK CONDUCTANCE OF JAN CRYSTALS |
| OPERATING TEST CAPABILITY | INDICATED RES 500 OHMS FOR GOOD CRYSTALS; RES RATIO 10 TO 1 FOR GOOD CRYSTALS |
| INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| HEIGHT | 2.625 INCHES NOMINAL |
| LENGTH | 7.375 INCHES NOMINAL |
| WIDTH | 4.375 INCHES NOMINAL |
| NONDEFINITIVE SPEC/STD DATA | NO. TS-268 TO U SERIES TYPE |