Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-222-1117 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 5999965, TS3253TPM39, TS-3253/TPM-39, 6625-00-222-1117, 00-222-1117, 6625002221117, 002221117
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 10, 1972 | 00-222-1117 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-222-1117
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 5999965 | 24930 | HARRIS CORPORATIONDBA ELECTRONIC SYSTEMS, RADAR |
| TS-3253/TPM-39 | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-222-1117
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MICROWAVE DIODE CURRENT |
| OPERATING TEST CAPABILITY | MICROAMPHERE METER RANGE 0-1000 UA DC |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | ALUMINUM HOUSING |
| SURFACE TREATMENT | ENAMEL |
| HEIGHT | 3.880 INCHES NOMINAL |
| LENGTH | 5.500 INCHES NOMINAL |
| WIDTH | 4.250 INCHES NOMINAL |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,SEMICONDUCTOR DEVICE |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TS-3253/TPM-39 |
| FSC APPLICATION DATA | TEST SET,ELECT. EQUIP. |