Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-305-1444 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 6200B, 6625-00-305-1444, 00-305-1444, 6625003051444, 003051444
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | OCT 17, 1973 | 00-305-1444 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-305-1444
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 6200B | 72314 | BAE SYSTEMS INFORMATION ANDELECTRONIC SYSTEMS INTEGRATION I |
Technical Data | NSN 6625-00-305-1444
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | PARAMETER CHARACTERIZATION OF SEMICONDUCTOR DEVICES |
| END ITEM IDENTIFICATION | ELECTRONIC SYSTEMS TEST SETS |