NSN 6625-00-324-0572

Part Details | TEST LEAD

6625-00-324-0572 A definite length of wire or cable with a CLIP (1), ELECTRICAL; CONNECTOR, PLUG, ELECTRICAL; CONNECTOR, RECEPTACLE, ELECTRICAL; JACK, TELEPHONE; PLUG, TELEPHONE; JACK, TIP; PLUG, TIP; or the like on one or both ends, and PROD, TEST on either end but not both ends. Active electronic components such as Capacitors, ELECTRON TUBE, Resistors, Semiconductor devices, and the like may be mounted into and included with LEAD, TEST for attenuation or amplification purposes. May or may not include accessories, such as CLIP (1), ELECTRICAL; TIP, TEST PROD; PROD, TEST; and TEST LEAD ATTACHMENT. For items consisting of more than one LEAD, TEST see LEAD SET, TEST. For items designed for direct attachment to a LEAD, TEST see PROD, TEST. For items designed for indirect attachment to a LEAD, TEST see TEST LEAD ATTACHMENT. For items not specifically designed for test purposes see LEAD, ELECTRICAL.

Alternate Parts: AV5283C, AV-5283C, AV5283A, AV-5283A, 10601DMOD100, 302, FMT51711, FMT-5171-1, 100202, 100-202, 4011912, 401-1912, SMI517561, SMI-5175-61, P6006, 010016000, 010-0160-00, P6006, 465574, 6625-00-324-0572, 00-324-0572, 6625003240572, 003240572

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66MAR 24, 197900-324-057208059 ( LEAD, TEST )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-324-0572
Part Number Cage Code Manufacturer
AV-5283C58414AVEX ELECTRONICS CORP.
AV-5283A58414AVEX ELECTRONICS CORP.
10601DMOD10050423BALLANTINE LABORATORIES INC
30283330DIALIGHT CORPORATION
FMT-5171-153692FEIER H TOOL AND MACHINE CO INC
100-20228569HICKOK INCORPORATED
401-1912A486GNIMIKKEISTOKESKUS NCB FINLAND
SMI-5175-6156838SYSTEMS ELECTRONICS MARKETING INC
P600680009TEKTRONIX, INC.DBA TEKTRONIX
010-0160-0080009TEKTRONIX, INC.DBA TEKTRONIX
P600657712TELEMECHANICS INC
465574F6980THALES TRAINING ET SIMULATION SAS
Technical Data | NSN 6625-00-324-0572
Characteristic Specifications
SPECIAL FEATURES10 MEGOHM LOAD
FSC APPLICATION DATAELEC,ELECT. PROPERTIES MEASURING AND TEST INSTRUMENTS