Part Details | ELECTRONIC SYSTEMS TEST SET GROUP
6625-00-327-2334 A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets.
Alternate Parts: 0Q188FSC, 65053502QAT03, 6505-3502QAT03, 6625-00-327-2334, 00-327-2334, 6625003272334, 003272334
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 03, 1973 | 00-327-2334 | 22957 ( TEST SET GROUP, ELECTRONIC SYSTEMS ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-327-2334
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 0Q188FSC | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
| 6505-3502QAT03 | 11530 | LOCKHEED MARTIN CORPORATIONDIV LOCKHEED MARTIN INFORMATION |
Technical Data | NSN 6625-00-327-2334
| Characteristic | Specifications |
|---|---|
| COMPONENT DOCUMENT ORIGIN | GOVERNMENT |
| DOCUMENT TYPE | NOMENCLATURE CARD |
| DOCUMENT IDENTIFICATION | OQ188/FSC |
| COMPONENT DOCUMENT PAGE NUMBER | 1 |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET GROUP,ELECTRONIC SYSTEMS |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | OQ188/FSC |