NSN 6625-00-352-0097

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-352-0097 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: TS268DU, 6625-00-352-0097, 00-352-0097, 6625003520097, 003520097

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196100-352-009725006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-352-0097
Part Number Cage Code Manufacturer
TS268DU80058JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM
Technical Data | NSN 6625-00-352-0097
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDFRONT AND BACK RESISTANCE BACK TO FRONT RESISTANCE RATIOS BACK CURRENTS
OPERATING TEST CAPABILITY0 TO 1.0 MA
ELECTRICAL POWER SOURCE RELATIONSHIP SELF-CONTAINED
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
MATERIAL AND LOCATION ALUMINUM HOUSING
SURFACE TREATMENT PAINT
HEIGHT4.750 INCHES NOMINAL
LENGTH7.500 INCHES NOMINAL
WIDTH5.750 INCHES NOMINAL
MAJOR COMPONENTSTECH MANUAL
ACCESSORY COMPONENT QUANTITY2
ACCESSORY CONTROLLING AGENCYSIG