Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-367-9323 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 120, 6625-00-367-9323, 00-367-9323, 6625003679323, 003679323
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 27, 1974 | 00-367-9323 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-367-9323
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 120 | 51089 | FAIRCHILD SEMICONDUCTOR CORPPCB-TEST TESTLINE DIV |
Technical Data | NSN 6625-00-367-9323
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF TRANSISTORS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| FUNCTIONAL CLASSIFICATION | AA-9.3 |