NSN 6625-00-376-5379

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-376-5379 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: ANUSM304, 6625-00-376-5379, 00-376-5379, 6625003765379, 003765379

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66MAR 16, 197400-376-537925006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-376-5379
Part Number Cage Code Manufacturer
ANUSM30480058JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM
Technical Data | NSN 6625-00-376-5379
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDPEAK FORWARD BLOCKING VOLTAGE; REVERSE FORWARD BLOCKING VOLTAGE; PEAK FORWARD BLOCKING CURRENT; REVERSE FORWARD BLOCKING CURRENT; GATE CURRENT; HOLDING CURRENT; TURN OFF TIME
MATERIAL AND LOCATION ALUMINUM HOUSING
HEIGHT13.375 INCHES NOMINAL
LENGTH13.750 INCHES NOMINAL
WIDTH11.438 INCHES NOMINAL
MAJOR COMPONENTSPOWER CABLE,TEST CABLE,TEST SET,SEMICONDUCTOR DEVICES
ACCESSORY COMPONENT QUANTITY3
ACCESSORY CONTROLLING AGENCYDOD
ACCESSORY IDENTIFYING NUMBERSCR116 TYPE NO. AND SCR111 TYPE NO. AND TS2782 TO USM304 TYPE NO.
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAMETEST SET,SEMICONDUCTOR DEVICES
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBERAN/USM304