Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-528-6768 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TF26, 6625-00-528-6768, 00-528-6768, 6625005286768, 005286768
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 01, 1974 | 00-528-6768 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-528-6768
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TF26 | 33347 | SENCORE, INC. |
Technical Data | NSN 6625-00-528-6768
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TRANSISTOR TESTER |
| PHASE | SINGLE |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SPECIAL FEATURES | GO/NO GO TEST IN OR OUT OF CIRCUIT; CONNECT TEST LEADS IN ANY ORDER ; ROTATING SWITCH; ORDER PROBE SEPARATELY FOR TESTING PC BOARDS |