Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-580-4166 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TS1100U, TS1100AU, 6625-00-580-4166, 00-580-4166, 6625005804166, 005804166
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1961 | 00-580-4166 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-580-4166
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TS1100U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
| TS1100AU | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-580-4166
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASURE BETA OF TRANSISTOR |
| OPERATING TEST CAPABILITY | BETA UP TO 300 IN 4 RANGES AND ICO UP TO 500 MICROAMPS IN 2 RANGES |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | PLASTIC, PHENOLIC CARRYING CASE |
| HEIGHT | 9.200 INCHES NOMINAL |
| LENGTH | 7.700 INCHES NOMINAL |
| WIDTH | 6.600 INCHES NOMINAL |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,TRANSISTOR |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TS/1100A/U |
| SPECIAL FEATURES | TRANSISTOR UNDER TEST DOES NOT HAVE TO BE REMOVED FROM CIRCUIT FOR TEST |
| FUNCTIONAL CLASSIFICATION | A-9.3 |
| REFERENCE DATA AND LITERATURE | T.O. 33A1-3-149-1 |