Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-643-1075 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TS268BU, 6625-00-643-1075, 00-643-1075, 6625006431075, 006431075
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1963 | 00-643-1075 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-643-1075
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TS268BU | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-643-1075
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF RESISTANCE AND CURRENT |
| OPERATING TEST CAPABILITY | RES RANGE 0 TO 10 KILOHMS; CURRENT RANGE 0 TO 1 MA |
| ELECTRICAL POWER SOURCE RELATIONSHIP | SELF-CONTAINED |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | ALUMINUM HOUSING |
| HEIGHT | 4.370 INCHES NOMINAL |
| LENGTH | 7.500 INCHES NOMINAL |
| WIDTH | 5.750 INCHES NOMINAL |