Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-644-5754 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TS268CU, TS-268/CU, 6625-00-644-5754, 00-644-5754, 6625006445754, 006445754
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1961 | 00-644-5754 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-644-5754
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TS-268/CU | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-644-5754
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | CURRENT MEASUREMENT,RESISTANCE MEASUREMENT |
| OPERATING TEST CAPABILITY | CRYSTAL TESTER,INDICATES GOOD CRYSTAL-POOR CRYSTAL,CURRENT RANGE 0 TO 1 MA,RESISTANCE RANGE 0 TO INFINITY IN KILOHMS,FIVE COLOR INDICATION SCALES,GREEN FOR GOOD-RED FOR POOR |
| DC VOLTAGE RATING | A1.5 VOLTS |
| INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| HEIGHT | 3.620 INCHES NOMINAL |
| LENGTH | 7.870 INCHES NOMINAL |
| WIDTH | 5.500 INCHES NOMINAL |
| MAJOR COMPONENTS | ALL COMPONENTS AND ACCESSORIES LISTED IN TM11-215 |