NSN 6625-00-669-1215

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-669-1215 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: TS268EU, MILC10731, TS268EU, 6625-00-669-1215, 00-669-1215, 6625006691215, 006691215

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196300-669-121525006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-669-1215
Part Number Cage Code Manufacturer
TS268EU80058JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM
MILC1073181349MILITARY SPECIFICATIONSPROMULGATED BY MILITARY
TS268EU81349MILITARY SPECIFICATIONSPROMULGATED BY MILITARY
Technical Data | NSN 6625-00-669-1215
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDFORWARD AND BACKWARD RESISTANCE
OPERATING TEST CAPABILITYRESISTANCE RANGE 0-10000 OHMS
ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
DC VOLTAGE RATINGA1.5 VOLTS
INTERNAL BATTERY ACCOMMODATION INCLUDED
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
HEIGHT10.500 INCHES NOMINAL
LENGTH8.000 INCHES NOMINAL
WIDTH6.500 INCHES NOMINAL
FUNCTIONAL CLASSIFICATIONAA-1.3
FUNCTIONAL DESCRIPTIONPORTABLE SELF CONTAINED TEST SET USED TO MAKE QUALITATIVE TESTS ON RADIO FREQUENCY CRYSTAL RECTIFIERS
TYPE/MODEL DESIGNATIONTS-268E/U
RELATIONSHIP TO SIMILAR EQUIPMENTINTERCHANGEABLE W/6625-00-557-0398; SUITABLE SUBSTITUTE 6625-00-188-5851; 6625-00-352-0097; 6625-00-393-2521;6625-00-504-1949; 6625-00-610-2224; 6625-00-643-3107; 6625-00-982-5255
REFERENCE DATA AND LITERATURETM11-1242,TM11-6625-305-12P,TM11-6625-305-35P,TB11-6625-305-35/1
ENTRY DATE70-08-15