Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-724-8444 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: ST2954, 6625-00-724-8444, 00-724-8444, 6625007248444, 007248444
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1963 | 00-724-8444 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-724-8444
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| ST2954 | 71791 | CURTISS-WRIGHT CONTROLS, INC.DBA CURTISS WRIGHT |
Technical Data | NSN 6625-00-724-8444
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF TRANSISTORS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| FUNCTIONAL CLASSIFICATION | AA-9.3 |