Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-788-9927 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 245M, 6625-00-788-9927, 00-788-9927, 6625007889927, 007889927
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1960 | 00-788-9927 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-788-9927
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 245M | 93346 | COBHAM ADVANCED ELECTRONIC SOLUTIONSINC. |
Technical Data | NSN 6625-00-788-9927
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT |
| OPERATING TEST CAPABILITY | MEASURES THE BETH OF A TRANSISTOR,THE RESISTANCE APPEARING ELECTRODES OF A TRANSISTOR OR DIODE,THE REVERSE LEAKAGE OF A SHORTED OR OPEN CONDITION OF THE INTERNAL BATTERIES SO THAT THEY MAY BE REPLACED WHEN REQUIRED |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| DC VOLTAGE RATING | A4.5 VOLTS |
| INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | PLASTIC HOUSING |
| ACCESSORY COMPONENT QUANTITY | 1 |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| FUNCTIONAL CLASSIFICATION | AA-9.3 |