Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-808-1801 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 575M0D122C, 6625-00-808-1801, 00-808-1801, 6625008081801, 008081801
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1962 | 00-808-1801 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-808-1801
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 575M0D122C | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-00-808-1801
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | DYNAMIC CHARACTERISTIC CURVES OF JUNCTION AND POINT CONTACT TRANSISTORS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | B105.0 VOLTS AND C125.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C60.0 HERTZ |
| PHASE | SINGLE |
| INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| HEIGHT | 13.000 INCHES NOMINAL |
| LENGTH | 24.000 INCHES NOMINAL |
| WIDTH | 16.750 INCHES NOMINAL |
| FUNCTIONAL CLASSIFICATION | AA-3.3 |
| FUNCTIONAL DESCRIPTION | USED IN CHECKING AND MATCHING TRANSISTORS IN POWER SUPPLIES OF GP-4 |
| RELATIONSHIP TO SIMILAR EQUIPMENT | WHEN EXHAUSTED USE 6625002023475 |
| REFERENCE DATA AND LITERATURE | T.O. 33A1-12-511-11 |
| ENTRY DATE | 70-04-01 |