NSN 6625-00-844-7105

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-844-7105 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 219Z, 219Z, 6625-00-844-7105, 00-844-7105, 6625008447105, 008447105

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196200-844-710525006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-844-7105
Part Number Cage Code Manufacturer
219Z11530LOCKHEED MARTIN CORPORATIONDIV LOCKHEED MARTIN INFORMATION
219Z3VUJ2LOCKHEED MARTIN CORPORATIONDIV SPACE SYSTEMS
Technical Data | NSN 6625-00-844-7105
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDINDICATES LEAKAGE CURRENT,MEASURES TRANSISTOR BETA IN CIRCUIT
OPERATING TEST CAPABILITYBETA RANGE 1 TO 120; LEAKAGE CURRENT RANGE 0 TO 500 UA
DC VOLTAGE RATINGA12.0 VOLTS
INTERNAL BATTERY ACCOMMODATION INCLUDED
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
MATERIAL AND LOCATION PLASTIC HOUSING
HEIGHT6.500 INCHES NOMINAL
LENGTH9.000 INCHES NOMINAL
WIDTH7.625 INCHES NOMINAL
SPECIAL FEATURESCONTAINS 2 SEPERATE 12 VOLT BATTERY SUPPLIES; HOUSED IN PLASTIC CASE/HOUSING WITH HANDLE
FUNCTIONAL CLASSIFICATIONAA-9.3
FUNCTIONAL DESCRIPTIONSELF-CONTAINED PORTABLE INSTRUMENT THAT MEASURES THE BETA PARAMETER OF A TRANSISTOR WITHOUT REMOVING THE TRANSISTOR FROM THE CIRCUIT
REFERENCE DATA AND LITERATURET.O. 33A1-12-287-11