NSN 6625-00-893-2628

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-893-2628 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: TS1836U, 219B, SK147103, SK14710-3, 190311, 190-31-1, 190311, 190-31-1, 6625-00-893-2628, 00-893-2628, 6625008932628, 008932628

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196000-893-262825006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-893-2628
Part Number Cage Code Manufacturer
TS1836U80058JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM
219B23663JOSLYN PRODUCTS
SK14710-323663JOSLYN PRODUCTS
190-31-125549LITTON SYSTEMS INCAMECOM DIV
190-31-192755NORTHROP GRUMMAN SYSTEMS CORPORATIONDBA LAND & SELF PROTECTION SYSTEM
Technical Data | NSN 6625-00-893-2628
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDMEASUREMENT OF BETA PARAMETER AND LEAKAGE CURRENT
OPERATING TEST CAPABILITYBETA TEST RANGE 1 TO 300,LEAKAGE CURRENT TEST RANGE 0 TO 500 UA
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
MATERIAL AND LOCATION PLASTIC HOUSING
HEIGHT8.500 INCHES NOMINAL
LENGTH6.370 INCHES NOMINAL
WIDTH6.870 INCHES NOMINAL
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAMETEST SET,TRANSISTOR
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBERTYPE NO. TS-1836/U
FUNCTIONAL CLASSIFICATIONAA-9.3