Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-902-9562 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TT22, TS2086U, 6625-00-902-9562, 00-902-9562, 6625009029562, 009029562
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1960 | 00-902-9562 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-902-9562
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TT22 | 14558 | ABBEY ELECTRONICS CORP DIV OFLIQUIDONICS INDUSTRIES INC |
| TS2086U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-902-9562
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | INCIRCUIT - SATURATION VOLTAGE AND RESISTANCE OF TRANSISTORS,DIODE AND SCR FORWATD,CHARACTERISTICS OUT-OF-CIRCUIT,SATURATION VOLTAGE AND RESISTANCE OF TRANSISTORS,DIODE AND SCR FORWARD,CHARACTEREISTICS,TRANSISTOR CURRENT GAIN,TRANSISTOR LEAKAGE CURRENT,REVERSE CHARACTERISTICS OF DIODES AND SCRS |
| OPERATING TEST CAPABILITY | SATURATION VOLTAGE - 0.3V,0-3V SATURATION RESISTANCE -0-10 X1,X10,X100,COLLECTOR TEST CURRENT - 2.5,25,250 MA REVERSE LEAKAGE CURRENT - 0-30,VA,0.3 MA,0-30MA,0-300 MA,CURRENT GRAIN,BETA - 1-30,10-300,ACCURACY - PORM 5 PCT IN-CIRCUIT,PORM 3 PCT OUT-OF-CIRCUIT |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | PLASTIC HOUSING |
| SURFACE TREATMENT | PAINT |
| HEIGHT | 5.750 INCHES NOMINAL |
| LENGTH | 8.000 INCHES NOMINAL |
| WIDTH | 5.500 INCHES NOMINAL |
| MAJOR COMPONENTS | CABLE ASSEMBLY DEVICE;LEAD,TEST;ADAPTER,CRYSTAL SOCKET |
| ACCESSORY COMPONENT QUANTITY | A1$$A1$$A1 |
| ACCESSORY CONTROLLING AGENCY | ABBEY ELECTRONICS CORP AND ABBEY ELECTRONICS CORP AND ABBEY ELECTRONICSCORP |
| ACCESSORY IDENTIFYING NUMBER | A2262006 PART NO. AND A2262007 PART NO. AND A2202047 PART NO. |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,SEMICONDUCTOR DEVICE |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. TS-2086/U |
| FSC APPLICATION DATA | ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS |