Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-923-6534 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TS268EU, 6625-00-923-6534, 00-923-6534, 6625009236534, 009236534
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 11, 1965 | 00-923-6534 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-923-6534
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TS268EU | 94518 | VORON ELECTRONICS CORP |
Technical Data | NSN 6625-00-923-6534
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
| OPERATING TEST CAPABILITY | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
| INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| HEIGHT | 3.625 INCHES NOMINAL |
| LENGTH | 8.187 INCHES NOMINAL |
| WIDTH | 6.000 INCHES NOMINAL |