NSN 6625-00-926-1341

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-926-1341 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 3, 6625-00-926-1341, 00-926-1341, 6625009261341, 009261341

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66APR 13, 196600-926-134125006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-926-1341
Part Number Cage Code Manufacturer
324623TEST EQUIPMENT CORP
Technical Data | NSN 6625-00-926-1341
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDAC CURRENT GAIN; SATURATION; LEAKAGE CURRENT
OPERATING TEST CAPABILITYAC CURRENT GAIN RANGE 3 TO 100 AND 30 TO 1000,AC TEST FREQ 1 KHZ PORM 10 PCT OF TOTAL; SATURATION VOLTAGE RANGE 0.3 TO 3V FULL SCALE; LEAKAGE CURRENT RANGE 0.03,0.3,3 OR 30 MA FULL SCALE AT 6V
DC VOLTAGE RATINGA13.5 VOLTS
INTERNAL BATTERY ACCOMMODATION INCLUDED
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
MATERIAL AND LOCATION ALUMINUM CARRYING CASE
HEIGHT6.000 INCHES NOMINAL
LENGTH9.000 INCHES NOMINAL
WIDTH6.000 INCHES NOMINAL
MAJOR COMPONENTSADAPTER,TRANSISTOR
ACCESSORY COMPONENT QUANTITY1
ACCESSORY CONTROLLING AGENCYTEST EQUIPMENT CORP
ACCESSORY IDENTIFYING NUMBERTA-1 PART NO.