NSN 6625-00-953-8196

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-953-8196 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 3490, 6625-00-953-8196, 00-953-8196, 6625009538196, 009538196

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196200-953-819625006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-953-8196
Part Number Cage Code Manufacturer
349060741TRIPLETT BLUFFTON CORPORATIONDBA LFE INSTRUMENTS
Technical Data | NSN 6625-00-953-8196
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDPOWER AND SIGNAL
ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
AC VOLTAGE RATINGA110.0 VOLTS
FREQUENCY RATINGA60.0 HERTZ
PHASE SINGLE
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
DEPTH15.000 INCHES NOMINAL
HEIGHT8.000 INCHES NOMINAL
WIDTH19.000 INCHES NOMINAL
SPECIAL FEATURESMFG NAME-TRANSISTOR ANALYZER
SUPPLEMENTARY FEATURESPORTABLE; 3 INDEPENDENT POWER SUPPLIESENT POWER SUPPLIES; COLLECTOR CURRENTS TO 10 AMPERES; INPUT CURRENTS TO 1 AMPERE; SEPARATE INPUT AND COLLECTOR METERS
FUNCTIONAL DESCRIPTIONANALYZES TRANSISTORS IN EITHER COMON BASE OR COMMON EMITTER CONFIG