Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-988-1887 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 300, 6625-00-988-1887, 00-988-1887, 6625009881887, 009881887
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1962 | 00-988-1887 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-988-1887
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 300 | 96641 | OWEN LABORATORIES INC |
Technical Data | NSN 6625-00-988-1887
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASURE TRANSISTOR CHARACTERISTICS; MEASURE DIODES |
| AC VOLTAGE RATING | A115.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C60.0 HERTZ |
| PHASE | SINGLE |
| INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| MATERIAL AND LOCATION | LEATHER CARRYING CASE |
| HEIGHT | 7.000 INCHES NOMINAL |
| LENGTH | 17.000 INCHES NOMINAL |
| WIDTH | 15.700 INCHES NOMINAL |
| FSC APPLICATION DATA | TEST SET,TRANSISTOR,EXCEPT SPECIALLY DESIGNED |