Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-034-0940 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 1249, 1249, 6625-01-034-0940, 01-034-0940, 6625010340940, 010340940
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 19, 1977 | 01-034-0940 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-034-0940
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1249 | 11837 | ELECTRO SCIENTIFIC INDUSTRIES INC |
| 1249 | 9Y504 | ELECTRO SCIENTIFIC INDUSTRIES, INC.DBA E S I |
Technical Data | NSN 6625-01-034-0940
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | EVALUATE DIGITAL INTEGRATED CIRCUITS |
| OPERATING TEST CAPABILITY | DATA SETUP TIME 230/800 NS; CLOCKPULSE WIDTH 140/440 NS; OUTPUT SETTLING TIME 630/2760 NS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | B117.0 VOLTS AND C234.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C60.0 HERTZ |
| PHASE | SINGLE |
| INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 12.200 INCHES NOMINAL |
| HEIGHT | 5.900 INCHES NOMINAL |
| WIDTH | 11.200 INCHES NOMINAL |