Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-192-7577 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 4145A, 4145A, 6625-01-192-7577, 01-192-7577, 6625011927577, 011927577
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | OCT 25, 1984 | 01-192-7577 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-192-7577
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 4145A | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| 4145A | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
Technical Data | NSN 6625-01-192-7577
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | STIMULATES VOLTAGE & CURRENT SENSITIVE DEVICES & MEASURES RESULTING CURRENT & VOLTAGE RESPONSES |
| OPERATING TEST CAPABILITY | VOLTAGE 3 RANGES: PORM 100 VOLTS; CURRENT 9 RANGES PORM 100 MILLIAMPS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | A100.0 VOLTS AND A120.0 VOLTS AND A220.0 VOLTS AND A240.0 VOLTS |
| FREQUENCY RATING | B48.0 HERTZ AND C66.0 HERTZ |
| INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| INCLOSURE FEATURE | MULTIPLE ITEM W/HOUSING |
| DEPTH | 24.100 INCHES NOMINAL |
| HEIGHT | 9.060 INCHES NOMINAL |
| WIDTH | 16.750 INCHES NOMINAL |
| MAJOR COMPONENTS | SEMICONDUCTOR PARAMETER ANALYZER 1; PLUG-IN MODULE 7 |
| FUNCTIONAL CLASSIFICATION | AA-9.6 |
| ENTRY DATE | 92-07-15 |