Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-258-7065 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 3701P, 370-1P, 370, 6625-01-258-7065, 01-258-7065, 6625012587065, 012587065
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUL 07, 1987 | 01-258-7065 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-258-7065
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 370-1P | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
| 370 | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-01-258-7065
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | ELECTROSTATIC DISCHARGE OF ELECTRICAL OVERSTRESS OF INTEGRATED CIRCUITS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | A115.0 VOLTS |
| FREQUENCY RATING | A60.0 HERTZ |
| PHASE | SINGLE |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 25.100 INCHES NOMINAL |
| HEIGHT | 13.100 INCHES NOMINAL |
| WIDTH | 16.900 INCHES NOMINAL |
| SPECIAL FEATURES | 7 INCH DIAG CRT; 16V,80V,400V,2000V RANGES |