Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-500-3007 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: PD02LEEC44, 6625-01-500-3007, 01-500-3007, 6625015003007, 015003007
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | AUG 20, 2002 | 01-500-3007 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-500-3007
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| PD02LEEC44 | 98752 | WARNER ROBINS AIR LOGISTICS CENTER |
Technical Data | NSN 6625-01-500-3007
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | A100.0 VOLTS AND A115.0 VOLTS AND A230.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C400.0 HERTZ |
| PHASE | SINGLE |
| INCLOSURE FEATURE | MULTIPLE ITEM W/CARRYING CASE |
| SPECIAL FEATURES | SUPPLIED ACCESSORIES WILL BE:ONE PAIR OF MICROPROBES,COMMON TEST LEADS,TWO MINI-CLIP LEADS,POWER CORD |