NSN 6625-01-529-5140

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-529-5140 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 990381, 99-0381, 2700S MIL, 6625-01-529-5140, 01-529-5140, 6625015295140, 015295140

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66APR 20, 200501-529-514025006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-529-5140
Part Number Cage Code Manufacturer
99-038157705HUNTRON INCDBA HUNTRON INSTRUMENTS
2700S MIL57705HUNTRON INCDBA HUNTRON INSTRUMENTS
Technical Data | NSN 6625-01-529-5140
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDCIRCUIT CARD ASSEMBLY
AC VOLTAGE RATINGB115.0 VOLTS AND C230.0 VOLTS
FREQUENCY RATINGB50.0 HERTZ AND C60.0 HERTZ
DC VOLTAGE RATINGB0.0 VOLTS AND C5.0 VOLTS
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
LENGTH11.500 INCHES NOMINAL
SPECIAL FEATURESWAVE FORM: SINE WAVE. CHANNELS (2), 40 PINS/CHANNEL
END ITEM IDENTIFICATIONGPETE
TYPE/MODEL DESIGNATION2700S
PART NAME ASSIGNED BY CONTROLLING AGENCYHUNTER TRACKER