Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-535-5582 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 990376, 99-0376, 6625-01-535-5582, 01-535-5582, 6625015355582, 015355582
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 02, 2005 | 01-535-5582 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-535-5582
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 99-0376 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-535-5582
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | AUTOMATED TEST PROBE FOR PRINTED CIRCUIT CARDS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | A115.0 VOLTS AND A230.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C60.0 HERTZ |
| PHASE | SINGLE |
| SPECIAL FEATURES | MAX PROBING AREA: 15.3" X 12.9"; MAX COMPONENT HEIGHT: 2.375"; COMPUTER INTERFACES: RS232 AND PCI BUS |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | ACCESS AUTOMATED PROBING STATION |